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physics.app-ph2020★ 8 cited
Fabrication of on-chip probes for double-tip scanning tunneling microscopy
Maarten Leeuwenhoek, Freek Groenewoud, Kees van Oosten +3
Reduction of the inter-probe distance in multi-probe and double-tip STM down to the nanometer scale has been a longstanding and technically difficult challenge. Recent multi-probe…
physics.app-ph2017★ 5 cited
Nanofabricated tips for device-based scanning tunneling microscopy
Maarten Leeuwenhoek, Richard A. Norte, Koen M. Bastiaans +5
We report on the fabrication and performance of a new kind of tip for scanning tunneling microscopy. By fully incorporating a metallic tip on a silicon chip using modern micromachi…