IP determination and 1+1 REMPI spectrum of SiO at 210-220 nm with implications for SiO${}^{+}$ ion trap loading

Patrick R. Stollenwerk, Ivan O. Antonov, Brian C. Odom

The 1+1 REMPI spectrum of SiO in the 210-220 nm range is recorded. Observed bands are assigned to the $A-X$ vibrational bands $(v‘‘=0-3,v‘=5-10)$ and a tentative assignment is giv…