most citedShape- and element-sensitive reconstruction of periodic nanostructures with grazing incidence X-ray fluorescence analysis and machine learning

27 citations · 64 across the 5 of their papers we have counts for

collaborators

5 papers

physics.app-ph2021★ 3 cited

Grazing incidence X-ray fluorescence based characterization of nanostructures for element sensitive profile reconstruction

Anna Andrle, Philipp Hönicke, Philipp Schneider +6

For the reliable fabrication of the current and next generation of nanostructures it is essential to be able to determine their material composition and dimensional parameters. Usi…

physics.optics2021★ 14 cited

Time-frequency analysis assisted reconstruction of ruthenium optical constants in the sub-EUV spectral range 8nm-23.75nm

Qais Saadeh, Philipp Naujok, Vicky Philipsen +9

The optical constants of ruthenium in the spectral range 8 nm to 23.75 nm with their corresponding uncertainties are derived from the reflectance of a sputtered ruthenium thin film…

physics.app-ph2021★ 27 cited

Shape- and element-sensitive reconstruction of periodic nanostructures with grazing incidence X-ray fluorescence analysis and machine learning

Anna Andrle, Philipp Hönicke, Grzegorz Gwalt +4

The characterization of nanostructured surfaces with sensitivity in the sub-nm range is of high importance for the development of current and next generation integrated electronic…

cs.LG2021

Invertible Neural Networks versus MCMC for Posterior Reconstruction in Grazing Incidence X-Ray Fluorescence

Anna Andrle, Nando Farchmin, Paul Hagemann +3

Grazing incidence X-ray fluorescence is a non-destructive technique for analyzing the geometry and compositional parameters of nanostructures appearing e.g. in computer chips. In t…

physics.app-ph2020★ 20 cited

Grazing incidence-X-ray fluorescence for a dimensional and elemental characterization of well-ordered nanostructures

Philipp Hönicke, Anna Andrle, Yves Kayser +6

The increasing importance of well-controlled ordered nanostructures on surfaces represents a challenge for existing metrology techniques. To develop such nanostructures and monitor…