53 citations · 71 across the 11 of their papers we have counts for
3 papers · 1 filter
A scanning probe microscopy approach for identifying defects in aluminum oxide
Leah Tom, Zachary J. Krebs, Joel B. Varley +8
The coherence of quantum dot qubits fabricated in semiconductors is often limited by charge noise from defects in gate dielectrics, which are material- and process-dependent. Chara…
Hydrogen Passivation Effects on Spatially Resolved Charge Trap Densities in Si(100)-SiO
Adam J. Czarnecki, Nikola L. Kolev, Patrick See +5
As silicon-based devices continue to shrink to the nanoscale, traps at the Si-SiO interface pose increasing challenges to device performance. These traps reduce channel carrier…
Probing Electrocatalytic Gas Evolution Reaction at Pt by Force Noise Measurements. Part 1-Hydrogen
Nataraju Bodappa, Zixiao Zhang, Ramin Yazdaanpanah +4
Electrocatalytic processes occurring at the heterogeneous interface are complex and their understanding at the molecular level remains challenging. Atomic force microscope (AFM) ca…