20 citations · 44 across the 3 of their papers we have counts for
8 papers
Grazing incidence X-ray fluorescence based characterization of nanostructures for element sensitive profile reconstruction
Anna Andrle, Philipp Hönicke, Philipp Schneider +6
For the reliable fabrication of the current and next generation of nanostructures it is essential to be able to determine their material composition and dimensional parameters. Usi…
Shape- and element-sensitive reconstruction of periodic nanostructures with grazing incidence X-ray fluorescence analysis and machine learning
Anna Andrle, Philipp Hönicke, Grzegorz Gwalt +4
The characterization of nanostructured surfaces with sensitivity in the sub-nm range is of high importance for the development of current and next generation integrated electronic…
Peculiarities in quantification of airborne particulate matter by means of Total Reflection X-ray Fluorescence
Yves Kayser, János Osán, Philipp Hönicke +1
Knowledge on the temporal and size distribution of particulate matter (PM) in air as well as on its elemental composition is a key information for source appointment, for the inves…
Speciation of FeS and FeS by means of X-ray Emission Spectroscopy using a compact full-cylinder von Hamos spectrometer
Malte Wansleben, John Vinson, André Wählisch +4
We present Fe K X-ray emission (XES) and Fe K X-ray absorption spectra (XAS) of Iron(II)sulfide (FeS) and Iron(II)disulfide (FeS). While XES and XAS offer different discrimi…
Grazing incidence-X-ray fluorescence for a dimensional and elemental characterization of well-ordered nanostructures
Philipp Hönicke, Anna Andrle, Yves Kayser +6
The increasing importance of well-controlled ordered nanostructures on surfaces represents a challenge for existing metrology techniques. To develop such nanostructures and monitor…
Interaction of nanoparticle properties and X-ray analytical techniques
Rainer Unterumsberger, Philipp Hönicke, Yves Kayse +5
In this work, Pt-Ti core-shell nanoparticles (NP) of 2 nm to 3 nm in size and 30000 u \pm 1500 u as specified single particle mass, deposited on flat silicon substrates by means of…