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cond-mat.mtrl-sci2024
Artificial Intelligence-Assisted Workflow for Transmission Electron Microscopy: From Data Analysis Automation to Materials Knowledge Unveiling
Marc Botifoll, Ivan Pinto-Huguet, Enzo Rotunno +17
(Scanning) transmission electron microscopy ((S)TEM) has significantly advanced materials science but faces challenges in correlating precise atomic structure information with the…
physics.ins-det2024
Increasing the resolution of transmission electron microscopy by computational ghost imaging
P. Rosi, L. Viani, E. Rotunno +5
By means of numerical simulations, we demonstrate the innovative use of computational ghost imaging in transmission electron microscopy to retrieve images with a resolution that ov…