2 papers
cond-mat.mtrl-sci2025
Machine Learning for Identifying Grain Boundaries in Scanning Electron Microscopy (SEM) Images of Nanoparticle Superlattices
Aanish Paruchuri, Carl Thrasher, A. J. Hart +2
Nanoparticle superlattices consisting of ordered arrangements of nanoparticles exhibit unique optical, magnetic, and electronic properties arising from nanoparticle characteristics…
eess.IV2024
Machine Learning for Analyzing Atomic Force Microscopy (AFM) Images Generated from Polymer Blends
Aanish Paruchuri, Yunfei Wang, Xiaodan Gu +1
In this paper we present a new machine learning workflow with unsupervised learning techniques to identify domains within atomic force microscopy images obtained from polymer films…