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20092026
most citedAdvances in Modeling of Scanning Charged-Particle-Microscopy Images

2 citations · 2 across the 5 of their papers we have counts for

collaborators

5 papers

physics.ins-det2026

Using a 4-megapixel hybrid photon counting detector for fast, lab-based nanoscale x-ray tomography

Jordan Fonseca, Zachary H. Levine, Joseph W. Fowler +8

Hybrid photon counting detectors (HPCDs) have unlocked new capabilities for x-ray-based measurements at synchrotrons around the world in the last 30 years. By leveraging independen…

physics.ins-det2025

Linnik point spread functions, time-reversed logarithmic diffusion equations, and blind deconvolution of electron microscope imagery

Alfred S. Carasso, Andras E. Vladar

A non iterative direct blind deconvolution procedure, previously used successfully to sharpen Hubble Space Telescope imagery, is now found useful in sharpening nanoscale scanning e…

physics.app-ph2020

Probing Electrified Liquid-Solid Interfaces with Scanning Electron Microscopy

Hongxuan Guo, Alexander Yulaev, Evgheni Strelcov +5

Electrical double layers play a key role in a variety of electrochemical systems. The mean free path of secondary electrons in aqueous solutions is on the order of a nanometer, mak…

physics.ins-det2010★ 2 cited

Advances in Modeling of Scanning Charged-Particle-Microscopy Images

Petr Cizmar, Andras E. Vladar, Michael T. Postek

Modeling artificial scanning electron microscope (SEM) and scanning ion microscope images has recently become important. This is because of the need to provide repeatable images wi…

physics.ins-det2009

Real-Time Scanning Charged-Particle Microscope Image Composition with Correction of Drift

Petr Cizmar, Andras E. Vladar, Michael T. Postek

In this article, a new scanning electron microscopy (SEM) image composition technique is described, which can significantly reduce drift related image corruptions. Drift-distortion…