activity
20192022
most citedThe role of lengthscale in the creep of Sn-3Ag-0.5Cu solder microstructures

23 citations · 40 across the 5 of their papers we have counts for

collaborators

5 papers

cond-mat.mtrl-sci2022★ 16 cited

Multi-scale plasticity homogenization of Sn-3Ag-0.5Cu: from β-Sn micropillars to polycrystals with intermetallics

Yilun Xu, Tianhong Gu, Jingwei Xian +4

The mechanical properties of -Sn single crystals have been systematically investigated using a combined methodology of micropillar tests and rate-dependent crystal plasticity mo…

cond-mat.mtrl-sci2021★ 1 cited

Accessing slip activity in high purity tin with electron backscatter diffraction and measurement of slip strength

Tianhong Gu, Finn Giuliani, T. Ben Britton

Beta-tin has been used widely as an interconnect in modern electronics. To improve the understanding of the reliability of these components, we directly measure the critical resolv…

physics.app-ph2020★ 23 cited

The role of lengthscale in the creep of Sn-3Ag-0.5Cu solder microstructures

Tianhong Gu, Christopher M. Gourlay, T. Ben Britton

Creep of directionally solidified Sn-3Ag-0.5Cu wt.% (SAC305) samples with near-<110> orientation along the loading direction and different microstructural lengthscale is investigat…

cond-mat.mtrl-sci2020

In-situ study of creep in Sn-3Ag-0.5Cu solder

Tianhong Gu, Vivian Tong, Christopher M. Gourlay +1

The creep behaviour and microstructural evolution of a Sn-3Ag-0.5Cu wt.% sample with a columnar microstructure have been investigated through in-situ creep testing under constant s…

cond-mat.mtrl-sci2019

In-situ electron backscatter diffraction of thermal cycling in a single grain Cu/Sn-3Ag-0.5Cu/Cu solder joint

Tianhong Gu, Christopher M. Gourlay, T. Ben Britton

The heterogeneous evolution of microstructure in a single Cu/SAC305/Cu solder joint is investigated using in-situ thermal cycling combined with electron backscatter diffraction (EB…