Spectroscopic thickness and quality metrics for PtSe${}_2$ layers produced by top-down and bottom-up techniques

Beata M. Szydłowska, Oliver Hartwig, Bartlomiej Tywoniuk +6

Thin films of noble-metal-based transition metal dichalcogenides, such as PtSe${}_2$, have attracted increasing attention due to their interesting layer-number dependent properties a…