Classification of diffraction patterns using a convolutional neural network in single particle imaging experiments performed at X-ray free-electron lasers

Dameli Assalauova, Alexandr Ignatenko, Fabian Isensee +3

Single particle imaging (SPI) at X-ray free electron lasers (XFELs) is particularly well suited to determine the 3D structure of particles in their native environment. For a succes…