31 citations · 37 across the 2 of their papers we have counts for
3 papers
Contamination of TEM Holders Quantified and Mitigated with Open-Hardware, High-Vacuum Bakeout System
Yin Min Goh, Jonathan Schwartz, Emily Rennich +3
Hydrocarbon contamination plagues high-resolution and analytical electron microscopy by depositing carbonaceous layers onto surfaces during electron irradiation, which can render c…
Dynamic Compressed Sensing for Real-Time Tomographic Reconstruction
Jonathan Schwartz, Huihuo Zheng, Marcus Hanwell +2
Electron tomography has achieved higher resolution and quality at reduced doses with recent advances in compressed sensing. Compressed sensing (CS) theory exploits the inherent spa…
Removing Stripes, Scratches, and Curtaining with Non-Recoverable Compressed Sensing
Jonathan Schwartz, Yi Jiang, Yongjie Wang +6
Highly-directional image artifacts such as ion mill curtaining, mechanical scratches, or image striping from beam instability degrade the interpretability of micrographs. These unw…