most citedAlleviation of Temperature Variation Induced Accuracy Degradation in Ferroelectric FinFET Based Neural Network

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cs.ET2021★ 3 cited

Neuromorphic Computing with Ferroelectric FinFETs in the Presence of Temperature, Process Variation, Device Aging and Flicker Noise

Sourav De, Bo-Han Qiu, Wei-Xuan Bu +4

This paper reports a comprehensive study on the impacts of temperature-change, process variation, flicker noise and device aging on the inference accuracy of pre-trained all-ferroe…