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cs.AR2007
A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs
J. L. Rossello, V. Canals, S. A. Bota +2
As technology scales down, the static power is expected to become a significant fraction of the total power. The exponential dependence of static power with the operating temperatu…
cs.AR2007
Smart Temperature Sensor for Thermal Testing of Cell-Based ICs
S. A. Bota, M. Rosales, J. L. Rossello +1
In this paper we present a simple and efficient built-in temperature sensor for thermal monitoring of standard-cell based VLSI circuits. The proposed smart temperature sensor uses…