activity
20132021
most citedKelvin probe force microscopy of metallic surfaces used in Casimir force measurements

52 citations · 190 across the 7 of their papers we have counts for

collaborators

7 papers

cond-mat.mtrl-sci2021★ 42 cited

Analysis of external and internal disorder to understand band-like transport in n-type organic semiconductors

Marc-Antoine Stoeckel, Yoann Olivier, Marco Gobbi +18

Charge transport in organic semiconductors is notoriously extremely sensitive to the presence of disorder, both internal and external (i.e. related to the interactions with the die…

cond-mat.mes-hall2021★ 32 cited

Multiscale charge transport in van der Waals thin films: reduced graphene oxide as case study

Alessandro Kovtun, Andrea Candini, Anna Vianelli +9

Large area van der Waals (vdW) thin films are assembled materials consisting of a network of randomly stacked nanosheets. The multi-scale structure and the two-dimensional nature o…

cond-mat.mtrl-sci2020★ 12 cited

Monitoring morphological and chemical properties during silver solid-state dewetting

M. Berni, I. Carrano, A. Kovtun +6

Solid-state dewetting phenomenon in silver thin films offers a straightforward method to obtain structures having controlled shape or size -this latter in principle spanning severa…

cond-mat.mtrl-sci2019★ 27 cited

Controlling the Functional Properties of Oligothiophene Crystalline Nano/Micro-Fibers via Tailoring of the Self-Assembling Molecular Precursors

Francesca Di Maria, Mattia Zangoli, Massimo Gazzano +13

Oligothiophenes are pi-conjugated semiconducting and fluorescent molecules whose self-assembly properties are widely investigated for application in organic electronics, optoelectr…

physics.chem-ph2018

Dynamically switching the surface electronic and electrostatic properties of indium tin oxide electrodes with photochromic monolayers

Qiankun Wang, Valentin Diez-Cabanes, Simone Dell'Elce +10

The chemical modification of electrodes with organic materials is a common approach to tune the electronic and electrostatic landscape between interlayers in optoelectronic devices…

cond-mat.mes-hall2014★ 52 cited

Kelvin probe force microscopy of metallic surfaces used in Casimir force measurements

R. O. Behunin, D. A. R. Dalvit, R. S. Decca +9

Kelvin probe force microscopy at normal pressure was performed by two different groups on the same Au-coated planar sample used to measure the Casimir interaction in a sphere-plane…