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eess.SY2022
Adaptive Outlier Detection for Power MOSFETs Based on Gaussian Process Regression
Kyohei Shimozato, Michihiro Shintani, Takashi Sato
Outlier detection of semiconductor devices is important since manufacturing variation is inherently inevitable. In order to properly detect outliers, it is necessary to consider th…
eess.SY2021
Accelerating Parameter Extraction of Power MOSFET Models Using Automatic Differentiation
Michihiro Shintani, Aoi Ueda, Takashi Sato
The extraction of the model parameters is as important as the development of compact model itself because simulation accuracy is fully determined by the accuracy of the parameters…