1 citations · 1 across the 1 of their papers we have counts for
2 papers
cs.CV2021
Machine-learning based methodologies for 3d x-ray measurement, characterization and optimization for buried structures in advanced ic packages
Ramanpreet S Pahwa, Soon Wee Ho, Ren Qin +9
For over 40 years lithographic silicon scaling has driven circuit integration and performance improvement in the semiconductor industry. As silicon scaling slows down, the industry…
cs.CV2020★ 1 cited
DDR-ID: Dual Deep Reconstruction Networks Based Image Decomposition for Anomaly Detection
Dongyun Lin, Yiqun Li, Shudong Xie +2
One pivot challenge for image anomaly (AD) detection is to learn discriminative information only from normal class training images. Most image reconstruction based AD methods rely…