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stat.ME2025
One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories
Christian Acal, Juan Eloy Ruiz-Castro, David Maldonado +1
A new probability distribution to study lifetime data in reliability is introduced in this paper. This one is a first approach to a non-homogeneous phase-type distribution. It is b…
stat.ME2025
An approach to non-homogenous phase-type distributions through multiple cut-points
Juan Eloy Ruiz-Castro, Christian Acal, Juan B. Roldán
A new class of distributions based on phase-type distributions is introduced in the current paper to model lifetime data in the field of reliability analysis. This one is the natur…
stat.ME2024
Stochastic modeling of Random Access Memories reset transitions
M Carmen Aguilera-Morillo, Ana M Aguilera, Francisco Jiménez-Molinos +1
Resistive Random Access Memories (RRAMs) are being studied by the industry and academia because it is widely accepted that they are promising candidates for the next generation of…