4 papers
One cut-point phase-type distributions in Reliability. An application to Resistive Random Access Memories
Christian Acal, Juan Eloy Ruiz-Castro, David Maldonado +1
A new probability distribution to study lifetime data in reliability is introduced in this paper. This one is a first approach to a non-homogeneous phase-type distribution. It is b…
Stochastic resonance in a metal-oxide memristive device
A. N. Mikhaylov, D. V. Guseinov, A. I. Belov +13
The stochastic resonance phenomenon has been studied experimentally and theoretically for a state-of-art metal-oxide memristive device based on yttria-stabilized zirconium dioxide…
Modeling the variability of memristive devices with hexagonal boron nitride as dielectric
Juan B. Roldan, David Maldonado, C. Aguilera-Pedregosa +6
Variability in memristive devices based on h-BN dielectrics is studied in depth. Different numerical techniques to extract the reset voltage are described and the corresponding cyc…
Variability in Resistive Memories
Juan B. Roldán, Enrique Miranda, David Maldonado +17
Resistive memories are outstanding electron devices that have displayed a large potential in a plethora of applications such as nonvolatile data storage, neuromorphic computing, ha…