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Robust Estimation in Step-Stress Experiments under Exponential Lifetime Distributions
María Jaenada, Juan Manuel Millán, Leandro Pardo
Many modern products exhibit high reliability, often resulting in long times to failure. Consequently, conducting experiments under normal operating conditions may require an impra…
Robust tests for log-logistic models based on minimum density power divergence estimators
A. Felipe, M. Jaenada, P. Miranda +1
The log-logistic distribution is a versatile parametric family widely used across various applied fields, including survival analysis, reliability engineering, and econometrics. Wh…
Robust statistical inference for accelerated life-tests with one-shot devices under log-logistic distributions
María González-Calderón, María Jaenada, Leandro Pardo
A one-shot device is a unit that operates only once, after which it is either destroyed or needs to be rebuilt. For this type of device, the operational status can only be assessed…