70 citations · 171 across the 12 of their papers we have counts for
6 papers · 1 filter
Metallicity-driven polar transitions in topological epilayers
Eduardo D. Stefanato, Nicolas M. Kawahala, Bianca A. Kawata +3
Polar metals, materials that exhibit both electric polarization and high conductivity, can also host topological phases. Because free carriers strongly suppress distortive polar or…
Morphology Control in van der Waals Epitaxy of Bismuth Telluride Topological Insulators
Celso I. Fornari, Eduardo Abramof, Paulo H. O. Rappl +2
Bismuth telluride have regained significant attention as a prototype of topological insulator. Thin films of high quality have been investigated as a basic platform for novel spint…
Hybrid reflections from multiple x-ray scattering in epitaxial bismuth telluride topological insulator films
Sergio L. Morelhao, Stefan Kycia, Samuel Netzke +3
Epitaxial films of bismuth telluride topological insulators have received increasing attention due to potential applications in spintronic and quantum computation. One of the most…
Lateral lattice coherence lengths in thin films of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical diffraction in monochromator crystals
Sergio L. Morelhao, Stefan Kycia, Samuel Netzke +3
In the supporting information file for article Dynamics of Defects in van der Waals Epitaxy of Bismuth Telluride Topological Insulators(J. Phys. Chem. C 2019, 123, 24818-24825, doi…
Magnetic-field-induced crossover from the inverse Faraday effect to the optical orientation in EuTe
V. V. Pavlov, R. V. Pisarev, S. G. Nefedov +6
A time-resolved optical pump-probe technique has been applied for studying the ultrafast dynamics in the magnetic semiconductor EuTe near the absorption band gap. We show that appl…
Nanoscale characterization of bismuth telluride epitaxic layers by advanced X-ray analysis
Sérgio L. Morelhão, Celso I. Fornari, Paulo H. O. Rappl +1
Topological insulator surface properties are strongly correlated to structural properties, requiring high-resolution techniques capable of probing both surface and bulk structures…