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20192024
most citedAn Encoder-Decoder Based Approach for Anomaly Detection with Application in Additive Manufacturing

7 citations · 24 across the 8 of their papers we have counts for

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6 papers · 1 filter

cs.LG2020★ 1 cited

Generalizing Fault Detection Against Domain Shifts Using Stratification-Aware Cross-Validation

Yingshui Tan, Baihong Jin, Qiushi Cui +2

Incipient anomalies present milder symptoms compared to severe ones, and are more difficult to detect and diagnose due to their close resemblance to normal operating conditions. Th…

cs.LG2020★ 2 cited

Using Ensemble Classifiers to Detect Incipient Anomalies

Baihong Jin, Yingshui Tan, Albert Liu +3

Incipient anomalies present milder symptoms compared to severe ones, and are more difficult to detect and diagnose due to their close resemblance to normal operating conditions. Th…

cs.LG2020★ 6 cited

Exploiting Uncertainties from Ensemble Learners to Improve Decision-Making in Healthcare AI

Yingshui Tan, Baihong Jin, Xiangyu Yue +2

Ensemble learning is widely applied in Machine Learning (ML) to improve model performance and to mitigate decision risks. In this approach, predictions from a diverse set of learne…

cs.LG2020★ 2 cited

Are Ensemble Classifiers Powerful Enough for the Detection and Diagnosis of Intermediate-Severity Faults?

Baihong Jin, Yingshui Tan, Yuxin Chen +2

Intermediate-Severity (IS) faults present milder symptoms compared to severe faults, and are more difficult to detect and diagnose due to their close resemblance to normal operatin…

cs.LG2019★ 6 cited

Augmenting Monte Carlo Dropout Classification Models with Unsupervised Learning Tasks for Detecting and Diagnosing Out-of-Distribution Faults

Baihong Jin, Yingshui Tan, Yuxin Chen +1

The Monte Carlo dropout method has proved to be a scalable and easy-to-use approach for estimating the uncertainty of deep neural network predictions. This approach was recently ap…

cs.LG2019★ 7 cited

An Encoder-Decoder Based Approach for Anomaly Detection with Application in Additive Manufacturing

Baihong Jin, Yingshui Tan, Alexander Nettekoven +4

We present a novel unsupervised deep learning approach that utilizes the encoder-decoder architecture for detecting anomalies in sequential sensor data collected during industrial…