2 papers
physics.ins-det2025
The development of IBIC microscopy at the 100 kV ion implanter of the University of Torino (LIUTo) and the application for the assessment of the radiation hardness of a silicon photodiode
Emilio Corte, Alberto Bortone, Elena Nieto Hernández +6
The Ion Beam Induced Charge (IBIC) technique is widely used to characterize the electronic properties of semiconductor materials and devices. Its main advantage over other charge c…
physics.ins-det2024
IBIC analysis of a linear position sensitive detector: model and experiment
Ettore Vittone, Georgios Provatas, Karla IvankoviÄ NiziÄ +1
The ion beam-induced charge (IBIC) analysis of a commercial silicon photodiode configured as a Position Sensitive Detector (PSD) for energetic charged particles is the subject of t…