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cond-mat.mtrl-sci2026
Context-Aware Deep Learning for Defect Classification in Atomic-Resolution STEM
Jiadong Dan, Cheng Zhang, Leyi Loh +5
Artificial intelligence is rapidly advancing materials characterization, yet most applications in electron microscopy rely solely on image contrast, overlooking the chemical and ex…
cond-mat.mtrl-sci2020
High-throughput ensemble characterization of individual core-shell nanoparticles with quantitative 3D density from XFEL single-particle imaging
Do Hyung Cho, Zhou Shen, Yungok Ihm +16
The structures, as building-blocks for designing functional nanomaterials, have fueled the development of versatile nanoprobes to understand local structures of noncrystalline spec…