4 citations · 6 across the 4 of their papers we have counts for
3 papers · 1 filter
Bulk nanocrystalline Al alloys with hierarchical reinforcement structures via grain boundary segregation and complexion formation
Tianjiao Lei, Jungho Shin, Daniel S. Gianola +1
Grain size engineering, particularly reducing grain size into the nanocrystalline regime, offers a promising pathway to further improve the strength-to-weight ratio of Al alloys. U…
Electron Backscattered Diffraction using a New Monolithic Direct Detector: High Resolution and Fast Acquisition
Fulin Wang, McLean P. Echlin, Aidan A. Taylor +6
A monolithic active pixel sensor based direct detector that is optimized for the primary beam energies in scanning electron microscopes is implemented for electron back-scattered d…
New techniques for imaging and identifying defects in electron microscopy
Daniel S. Gianola, T. Ben Britton, Stefan Zaefferer
Defects in crystalline materials control the properties of materials, and their characterization focuses our strategies to optimize performance. Electron microscopy has served as t…