Charge-Based Compact Model for Bias-Dependent Variability of 1/f Noise in MOSFETs

Nikolaos Mavredakis, Nikolaos Makris, Predrag Habas +1

Variability of low frequency noise (LFN) in MOSFETs is bias-dependent. Moderate- to large-sized transistors commonly used in analog/RF applications show 1/f-like noise spectra, res…