Effect of large-angle incidence on particle identification performance for light-charged ($Z\le 2$) particles by pulse shape analysis with a pad-type nTD silicon detector

Shoichiro Kawase, Takuya Murota, Hiroya Fukuda +17

In recent years, particle discrimination methods based on digital waveform analysis techniques for neutron-transmutation-doped silicon (nTD-Si) detectors have become widely used fo…