2 papers
cond-mat.mtrl-sci2020
Variation of TiO2/SiO2 mixed layers induced by different Xe+ ion energies
Tran Van Phuc, Miroslaw Kulik, Afag Madadzada +4
The broadening and optical parameters of TiO2/SiO2 transition layers depending on the ion energy have been investigated using the Rutherford Backscattering Spectrometry (RBS) and E…
nucl-ex2019
Level scheme of Sm obtained from Sm(,) reaction using coincidence spectrometer
Nguyen Ngoc Anh, Nguyen Quang Hung, Nguyen Xuan Hai +5
The level scheme of the compound Sm nucleus formed via the Sm(,) reaction is studied by using the coincidence spectrometer at Dalat Nuclear Researc…