57 citations · 140 across the 7 of their papers we have counts for
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cond-mat.mtrl-sci2020★ 57 cited
3D HR-EBSD characterization of the plastic zone around crack tips in tungsten single crystals at the micron scale
Szilvia Kalácska, Johannes Ast, Péter Dusán Ispánovity +2
High angular resolution electron backscatter diffraction (HR-EBSD) was coupled with focused ion beam (FIB) slicing to characterize the shape of the plastic zone in terms of geometr…
cond-mat.mtrl-sci2020★ 14 cited
In situ atomic force microscopy depth-corrected 3-dimensional focused ion beam based time-of-flight secondary ion mass spectroscopy: spatial resolution, surface roughness, oxidation
Lex Pillatsch, Szilvia Kalácska, Xavier Maeder +1
Atomic force microscopy (AFM) is a well-known tool for studying surface roughness and to collect depth information about features on the top atomic layer of samples. By combining s…