2 papers
physics.optics2025
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection
Qingdong Ou, Shuwen Xue, Weiliang Ma +13
Optical inspection has long served as a cornerstone non-destructive method in semiconductor wafer manufacturing, particularly for surface and defect analysis. However, conventional…
physics.app-ph2024
Pick-and-place transfer of arbitrary-metal electrodes for van der Waals device fabrication
Kaijian Xing, Daniel McEwen, Weiyao Zhao +12
Van der Waals electrode integration is a promising strategy to create near-perfect interfaces between metals and two-dimensional materials, with advantages such as eliminating Ferm…