2 papers
cond-mat.mtrl-sci2020
Complementary LEEM and eV-TEM for imaging and spectroscopy
Peter S. Neu, Daniël Geelen, Aniket Thete +2
Transmission electron microscopy at very low energy is a promising way to avoid damaging delicate biological samples with the incident electrons, a known problem in conventional tr…
cond-mat.mtrl-sci2019
Non-universal Transverse Electron Mean Free Path through Few-layer Graphene
D. Geelen, J. Jobst, E. E. Krasovskii +2
In contrast to the in-plane transport electron mean-free path in graphene, the transverse mean-free path has received little attention and is often assumed to follow the 'universal…