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Complete determination of crystallographic orientation of ReX2 (X=S, Se) by polarized Raman spectroscopy
Yun Choi, Keunui Kim, Soo Yeon Lim +5
Polarized Raman spectroscopy on few-layer ReS2 and ReSe2 was carried out to determine the crystallographic orientations. Since monolayer ReX2 (X=S or Se) has a distorted trigonal s…
Determination of the thickness and orientation of few-layer tungsten ditelluride using polarized Raman spectroscopy
Minjung Kim, Songhee Han, Jung Hwa Kim +3
Orthorhombic tungsten ditelluride (WTe2), with a distorted 1T structure, exhibits a large magnetoresistance that depends on the orientation, and its electrical characteristics chan…
Anomalous polarization dependence of Raman scattering and crystallographic orientation of black phosphorus
Jungcheol Kim, Jae-Ung Lee, Jinhwan Lee +4
We investigated polarization dependence of the Raman modes in black phosphorus (BP) using five different excitation wavelengths. The crystallographic orientation was determined by…