4 citations · 4 across the 1 of their papers we have counts for
3 papers
New categories of Safe Faults in a processor-based Embedded System
C. C. Gursoy, M. Jenihhin, A. S. Oyeniran +4
The identification of safe faults (i.e., faults which are guaranteed not to produce any failure) in an electronic system is a crucial step when analyzing its dependability and its…
High-Level Combined Deterministic and Pseudoexhuastive Test Generation for RISC Processors
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin +2
Recent safety standards set stringent requirements for the target fault coverage in embedded microprocessors, with the objective to guarantee robustness and functional safety of th…
Mixed-level identification of fault redundancy in microprocessors
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin +2
A new high-level implementation independent functional fault model for control faults in microprocessors is introduced. The fault model is based on the instruction set, and is spec…