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cs.CV2025
Are Foundation Models Ready for Industrial Defect Recognition? A Reality Check on Real-World Data
Simon Baeuerle, Pratik Khanna, Nils Friederich +4
Foundation Models (FMs) have shown impressive performance on various text and image processing tasks. They can generalize across domains and datasets in a zero-shot setting. This c…
cs.CV2024
Iterative Cluster Harvesting for Wafer Map Defect Patterns
Alina Pleli, Simon Baeuerle, Michel Janus +3
Unsupervised clustering of wafer map defect patterns is challenging because the appearance of certain defect patterns varies significantly. This includes changing shape, location,…
cs.CV2020
CAD2Real: Deep learning with domain randomization of CAD data for 3D pose estimation of electronic control unit housings
Simon Baeuerle, Jonas Barth, Elton Renato Tavares de Menezes +2
Electronic control units (ECUs) are essential for many automobile components, e.g. engine, anti-lock braking system (ABS), steering and airbags. For some products, the 3D pose of e…