1.4k citations · 1.5k across the 4 of their papers we have counts for
4 papers
Mapping Charge Recombination and the Effect of Point Defect Insertion in Gallium Arsenide Nanowire Heterojunctions
Brian Zutter, Hyunseok Kim, William Hubbard +4
Electronic devices are extremely sensitive to defects in their constituent semiconductors, but locating electronic point defects in bulk semiconductors has previously been impossib…
Differential electron yield imaging with STXM
William A. Hubbard, Jared J. Lodico, Xin Yi Ling +4
Total electron yield (TEY) imaging is an established scanning transmission X-ray microscopy (STXM) technique that gives varying contrast based on a sample's geometry, elemental com…
Dark-field transmission electron microscopy and the Debye-Waller factor of graphene
Brian Shevitski, Matthew Mecklenburg, William A. Hubbard +5
Graphene's structure bears on both the material's electronic properties and fundamental questions about long range order in two-dimensional crystals. We present an analytic calcula…
Graphene: A sub-nanometer trans-electrode membrane
S. Garaj, W. Hubbard, A. Reina +3
Isolated, atomically thin conducting membranes of graphite, called graphene, have recently been the subject of intense research with the hope that practical applications in fields…