2 papers
cond-mat.mes-hall2020
Mapping Charge Recombination and the Effect of Point Defect Insertion in Gallium Arsenide Nanowire Heterojunctions
Brian Zutter, Hyunseok Kim, William Hubbard +4
Electronic devices are extremely sensitive to defects in their constituent semiconductors, but locating electronic point defects in bulk semiconductors has previously been impossib…
cond-mat.mtrl-sci2020
Differential electron yield imaging with STXM
William A. Hubbard, Jared J. Lodico, Xin Yi Ling +4
Total electron yield (TEY) imaging is an established scanning transmission X-ray microscopy (STXM) technique that gives varying contrast based on a sample's geometry, elemental com…