In Situ characterization of the proton enhanced conductivity of 20nm TiO2 thin-films obtained on the surface of optical fiber

Jacob L. Poole, Paul R. Ohodnicki, Yang Yu +3

We report in situ characterized TiO2 thin-films deposited on optical fiber, having thicknesses in the 20-100nm range, and having enhanced conductivity values of 700S/cm upon intera…