2 papers
eess.SY2025
Local Rational Modeling for Identification Beyond the Nyquist Frequency: Applied to a Prototype Wafer Stage
Max van Haren, Lennart Blanken, Koen Classens +1
Fast-rate models are essential for control design, specifically to address intersample behavior. The aim of this paper is to develop a frequency-domain non-parametric identificatio…
eess.SY2024
Sampling in Parametric and Nonparametric System Identification: Aliasing, Input Conditions, and Consistency
Rodrigo A. González, Max van Haren, Tom Oomen +1
The sampling rate of input and output signals is known to play a critical role in the identification and control of dynamical systems. For slow-sampled continuous-time systems that…