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20022018
most citedMeasurement of Ultrafast Carrier Dynamics in Epitaxial Graphene

701 citations · 3.1k across the 11 of their papers we have counts for

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cond-mat.mtrl-sci2016★ 320 cited

Temperature Dependence of Wavelength Selectable Zero-Phonon Emission from Single Defects in Hexagonal Boron Nitride

Nicholas R. Jungwirth, Brian Calderon, Yanxin Ji +3

We investigate the distribution and temperature-dependent optical properties of sharp, zero-phonon emission from defect-based single photon sources in multilayer hexagonal boron ni…

cond-mat.mtrl-sci2008★ 36 cited

Emission of Terahertz Radiation from SiC

Jared H. Strait, Paul A. George, Jahan Dawlaty +4

We report the emission of strong coherent broadband terahertz radiation from 6H-Silicon-Carbide (SiC) excited with optical pulses. The measured terahertz spectral signal-to-noise r…

cond-mat.mtrl-sci2008★ 124 cited

Thickness Estimation of Epitaxial Graphene on SiC using Attenuation of Substrate Raman Intensity

Shriram Shivaraman, M. V. S. Chandrashekhar, John J. Boeckl +1

A simple, non-invasive method using Raman spectroscopy for the estimation of the thickness of graphene layers grown epitaxially on silicon carbide (SiC) is presented, enabling simu…

cond-mat.mtrl-sci2008★ 548 cited

Measurement of the Optical Absorption Spectra of Epitaxial Graphene from Terahertz to Visible

Jahan M. Dawlaty, Shriram Shivaraman, Jared Strait +6

We present experimental results on the optical absorption spectra of epitaxial graphene from the visible to the terahertz (THz) frequency range. In the THz range, the absorption is…

cond-mat.mtrl-sci2007★ 701 cited

Measurement of Ultrafast Carrier Dynamics in Epitaxial Graphene

Jahan M. Dawlaty, Shriram Shivaraman, Mvs Chandrashekhar +2

Using ultrafast optical pump-probe spectroscopy, we have measured carrier relaxation times in epitaxial graphene layers grown on SiC wafers. We find two distinct time scales associ…

cond-mat.mtrl-sci2002★ 2 cited

Growth and Characterization of Bulk Aluminum Nitride by Physical Vapor Transport

Tim K. Hossain, James V. Lindesay, Michael G. Spencer

A major issue in the development of the technology of nitride based materials is the choice of substrate. The structural and optical properties of the layers are intimately connect…