activity
20022026
most citedO- and H- induced surface core level shifts on Ru(0001): Prevalence of the additivity rule

14 citations · 24 across the 10 of their papers we have counts for

collaborators

10 papers

cond-mat.supr-con2026

Quadrupolar phase transition in superconducting lanthanum hydride

Abhishek Raghav, Kousuke Nakano, Marco Cherubini +2

Lanthanum hydride (LaH) has been widely studied for its high superconducting critical temperature of 250 K at about 170 GPa pressure. Although the structural -t…

cond-mat.other2026

Momentum-dependent charge-density-wave gap formation in ZrTe_{2.98}Se_{0.02}

Iori Ishiguro, Hayate Kunitsu, Natsuki Mitsuishi +5

We investigated the energy gap formation across the charge density wave (CDW) transition inof ZrTe_{2.98}Se_{0.02}. By employing a laser photoemission microscopy, we clearly resolv…

cond-mat.mtrl-sci2025

Composition/structure directed search for new chalcogenide compounds

Alon Hever, Ohad Levy, Stefano Curtarolo +1

This work presents a simple scheme for finding new crystalline compounds by adapting structure types from neighbor atoms compounds. The approach is demonstrated for the selenide an…

cond-mat.mtrl-sci2022

Field-Dependent Magnetic Domain Behavior in van der Waals FeGeTe

Yue Li, Rabindra Basnet, Krishna Pandey +6

Two-dimensional magnetic van der Waals (vdW) materials can show a variety of topological nontrivial spin textures, such as Bloch- or Néel-type stripe, skyrmion or bubble domains un…

cond-mat.mes-hall2021★ 2 cited

Structural and magnetic investigation of the interfaces of with and without NiO interlayer

Tobias Pohlmann, Florian Bertram, Jannis Thien +6

We present an investigation on the structural and magnetic properties of the interfaces of and by extracting cation-sele…

cond-mat.mtrl-sci2021

Laser-assisted atom probe tomography of c-plane and m-plane InGaN test structures

N. A. Sanford, P. T. Blanchard, M. D. Brubaker +6

Laser-assisted atom probe tomography (APT) was used to measure the indium mole fraction x of c-plane, MOCVD-grown, GaN/In(x)Ga(1-x)N/GaN test structures and the results were compar…