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most citedSpectro-microscopy of single and multi-layer graphene supported by a weakly interacting substrate

121 citations · 121 across the 1 of their papers we have counts for

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cond-mat.mtrl-sci2008121 cited

Spectro-microscopy of single and multi-layer graphene supported by a weakly interacting substrate

Kevin R. Knox, Shancai Wang, Alberto Morgante +6

We report measurements of the electronic structure and surface morphology of exfoliated graphene on an insulating substrate using angle-resolved photoemission and low energy electr…

cond-mat.mtrl-sci2005

Electronic structure and molecular orientation of a Zn-tetra-phenyl porphyrin multilayer on Si(111)

C. Castellarin Cudia, P. Vilmercati, R. Larciprete +13

The electronic properties and the molecular orientation of Zn-tetraphenyl-porphyrin films deposited on Si(111) have been investigated using synchrotron radiation. For the first tim…

cond-mat.mtrl-sci2004

The pseudomorphic to bulk fcc phase transition of thin Ni films on Pd(100)

G. A. Rizzi, A. Cossaro, M. Petukhov +6

We have measured the transformation of pseudomorphic Ni films on Pd(100) into their bulk fcc phase as a function of the film thickness. We made use of x-ray diffraction and x-ray i…

cond-mat.mtrl-sci2004

Surfactant-like Effect and Dissolution of Ultrathin Fe Films on Ag(001)

S. Terreni, A. Cossaro, G. Gonella +8

The phase immiscibility and the excellent matching between Ag(001) and Fe(001) unit cells (mismatch 0.8 %) make Fe/Ag growth attractive in the field of low dimensionality magnetic…

cond-mat.mtrl-sci2002

Quantum size effects in the low temperature layer-by-layer growth of Pb on Ge(001)

L. Floreano, D. Cvetko, F. Bruno +5

The electronic properties of thin metallic films deviate from the corresponding bulk ones when the film thickness is comparable with the wavelength of the electrons at the Fermi le…

cond-mat.mtrl-sci2002

Study of the isotropic contribution to the analysis of photoelectron diffraction experiments at the ALOISA beamline

F. Bruno, L. Floreano, A. Verdini +5

The angular distribution of the intensity in photoemission experiments is affected by electron diffraction patterns and by a smoothly varying ISO contribution originated by both in…