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cs.CV2025
MVREC: A General Few-shot Defect Classification Model Using Multi-View Region-Context
Shuai Lyu, Rongchen Zhang, Zeqi Ma +3
Few-shot defect multi-classification (FSDMC) is an emerging trend in quality control within industrial manufacturing. However, current FSDMC research often lacks generalizability d…
cs.CV2024
REB: Reducing Biases in Representation for Industrial Anomaly Detection
Shuai Lyu, Dongmei Mo, Waikeung Wong
Existing representation-based methods usually conduct industrial anomaly detection in two stages: obtain feature representations with a pre-trained model and perform distance measu…