2 papers
cs.CV2025
Semiconductor Wafer Map Defect Classification with Tiny Vision Transformers
Faisal Mohammad, Duksan Ryu
Semiconductor wafer defect classification is critical for ensuring high precision and yield in manufacturing. Traditional CNN-based models often struggle with class imbalances and…
cs.SE2025
Multimodal Learning for Just-In-Time Software Defect Prediction in Autonomous Driving Systems
Faisal Mohammad, Duksan Ryu
In recent years, the rise of autonomous driving technologies has highlighted the critical importance of reliable software for ensuring safety and performance. This paper proposes a…