2 papers
physics.optics2025
Dataset and Methodology for Material Identification Using AFM Phase Approach Curves
Stefan R. Anton, Denis E. Tranca, Stefan G. Stanciu +2
Atomic force microscopy (AFM) phase approach-curves have significant potential for nanoscale material characterization, however, the availability of robust datasets and automated a…
physics.optics2025
Inferring scattering-type Scanning Near-Field Optical Microscopy Data from Atomic Force Microscopy Images
Stefan G. Stanciu, Stefan R. Anton, Denis E. Tranca +7
Optical nanoscopy is crucial in life and materials sciences, revealing subtle cellular processes and nanomaterial properties. Scattering-type Scanning Near-field Optical Microscopy…