4 papers
Are Foundation Models Ready for Industrial Defect Recognition? A Reality Check on Real-World Data
Simon Baeuerle, Pratik Khanna, Nils Friederich +4
Foundation Models (FMs) have shown impressive performance on various text and image processing tasks. They can generalize across domains and datasets in a zero-shot setting. This c…
Rapid AI-based generation of coverage paths for dispensing applications
Simon Baeuerle, Ian F. Mendonca, Kristof Van Laerhoven +2
Coverage Path Planning of Thermal Interface Materials (TIM) plays a crucial role in the design of power electronics and electronic control units. Up to now, this is done manually b…
Iterative Cluster Harvesting for Wafer Map Defect Patterns
Alina Pleli, Simon Baeuerle, Michel Janus +3
Unsupervised clustering of wafer map defect patterns is challenging because the appearance of certain defect patterns varies significantly. This includes changing shape, location,…
MLOps for Scarce Image Data: A Use Case in Microscopic Image Analysis
Angelo Yamachui Sitcheu, Nils Friederich, Simon Baeuerle +3
Nowadays, Machine Learning (ML) is experiencing tremendous popularity that has never been seen before. The operationalization of ML models is governed by a set of concepts and meth…