most citedNon-destructive Depth-Resolved Characterization of Residual Strain Fields in High Electron Mobility Transistors using Differential Aperture X-ray Microscopy

3 citations · 4 across the 2 of their papers we have counts for

collaborators
Showing cond-mat.mtrl-sciShow all

1 paper · 1 filter

cond-mat.mtrl-sci2023★ 1 cited

Combining Synchrotron X-ray Diffraction, Mechanistic Modeling, and Machine Learning for In Situ Subsurface Temperature Quantification during Laser Melting

Rachel E. Lim, Tuhin Mukherjee, Chihpin Chuang +3

Laser melting, such as that encountered during additive manufacturing (AM), produces extreme gradients of temperature in both space and time, which in turn influence microstructura…