12 citations · 38 across the 5 of their papers we have counts for
5 papers
Morphology and Optical Properties of Thin Cd3As2 Films of a Dirac Semimetal Compound
Natalia Kovaleva, Ladislav Fekete, Dagmar Chvostova +1
Using atomic-force microscopy (AFM) and wide-band (0.02-8.5 eV) spectroscopic ellipsometry techniques we investigated morphology and optical properties of Cd3As2 films grown by non…
Bi layer properties in the Bi-FeNi GMR-type structures probed by spectroscopic ellipsometry
Natalia Kovaleva, Dagmar Chvostova, Ladislav Fekete +1
Bismuth (Bi) having a large atomic number is characterized by the strong spin-orbit coupling (SOC) and is a parent compound of many 3D topological insulators (TIs). The ultrathin B…
Bismuth layer properties in the ultrathin Bi-FeNi multilayer films probed by spectroscopic ellipsometry
N. N. Kovaleva, D. Chvostova, O. Pacherova +6
Using wide-band (0.5-6.5 eV) spectroscopic ellipsometry we study ultrathin [Bi(0.6-2.5 nm)-FeNi(0.8,1.2 nm)]N multilayer films grown by rf sputtering deposition, where the FeNi lay…
Localization Phenomena in Disordered Tantalum Films
Natalia Kovaleva, Dagmar Chvostova, A. Dejneka
Using dc transport and wide-band spectroscopic ellipsometry techniques we study localization phenomena in highly disordered metallic β-Ta films grown by rf sputtering deposition. T…
Localization effects in the disordered Ta interlayer of multilayer Ta-FeNi films: Evidence from dc transport and spectroscopic ellipsometry study
N. N. Kovaleva, D. Chvostova, O. Pacherova +4
Using dc transport and wide-band spectroscopic ellipsometry techniques, we study localization effects in the disordered metallic Ta interlayer of different thickness in the multila…