most citedDevelopment of a photothermal measurement model to determine layer thickness of multi-layered coating systems with unknown thermal properties

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math.NA2023★ 1 cited

Development of a photothermal measurement model to determine layer thickness of multi-layered coating systems with unknown thermal properties

Dimitri Rothermel, Thomas Schuster

In this article, a general model for 1D thermal wave interference is derived for multi-layered coating systems on a thermally thick substrate using the same principles as for the w…