12 citations · 20 across the 2 of their papers we have counts for
1 paper · 1 filter
A. Andrle, P. Hönicke, J. Vinson +5
The refractive index of a y-cut SiO2 crystal surface is reconstructed from polarization dependent soft X-ray reflectometry measurements in the energy range from 45 eV to 620 eV.…