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cs.AR2007
Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown
Jonathan R. Carter, Sule Ozev, Daniel J. Sorin
As device sizes shrink and current densities increase, the probability of device failures due to gate oxide breakdown (OBD) also increases. To provide designs that are tolerant to…
cs.AR2007
Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores
Anuja Sehgal, Fang Liu, Sule Ozev +1
Many SOCs today contain both digital and analog embedded cores. Even though the test cost for such mixed-signal SOCs is significantly higher than that for digital SOCs, most prior…