31 citations · 149 across the 20 of their papers we have counts for
6 papers · 1 filter
Cumulative X-ray Damage in Bismuth Selenide Examined by Simultaneous TXM and XRD
Sophie E Parsons, Bernard Kozioziemski, Daewoong Nam +21
Bismuth selenide (Bi2Se3) is a topological insulator with potential applications in thermoelectrics, spintronics, and optoelectronics. However, its response to radiation remains po…
Volume Collapse Without a Structural Transition in Shock-Compressed FeO
C. Crépisson, T. Stevens, M. Fitzgerald +121
We report x-ray diffraction and emission spectroscopy of FeO under laser-driven shock compression between 31-199 GPa. FeO retains the B1 (rocksalt) structure along the Hugoniot to…
Spin crossover in FeO under shock compression
Lélia Libon, Alessandra Ravasio, Silvia Pandolfi +17
FeO (wüstite), which exhibits complex electronic and structural properties with increasing pressure and temperature, is a key mineralogical phase for understanding deep planetary i…
Femtosecond temperature measurements of laser-shocked copper deduced from the intensity of the x-ray thermal diffuse scattering
J. S. Wark, D. J. Peake, T. Stevens +122
We present 50-fs, single-shot measurements of the x-ray thermal diffuse scattering (TDS) from copper foils that have been shocked via nanosecond laser-ablation up to pressures abov…
Simultaneous Bright- and Dark-Field X-ray Microscopy at X-ray Free Electron Lasers
Leora E. Dresselhaus-Marais, Bernard Kozioziemski, Theodor S. Holstad +40
The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural…
Atomistic deformation mechanism of silicon under laser-driven shock compression
S. Pandolfi, S. Brennan Brown, P. G. Stubley +10
Silicon (Si) is one of the most abundant elements on Earth, and it is the most important and widely used semiconductor, constituting the basis of modern electronic devices. Despite…